Pattern Trails: Visual Analysis of Pattern Transitions in Subspaces
D. Jäckle, M. Hund, M. Behrisch, D. A. Keim, T. Schreck
IEEE Conference on Visual Analytics Science and Technology (VAST), 2017D. Jäckle, M. Hund, M. Behrisch, D. A. Keim, T. Schreck
IEEE Conference on Visual Analytics Science and Technology (VAST), 2017