ODIX: A Rapid Hypotheses Testing System for Origin-Destination Data
J. Buchmüller, W. Jentner, D. Streeb, D. A. Keim
IEEE Conference on Visual Analytics Science and Technology (VAST Challenge 2017 MC1) // Award for Excellence in Spatio-Temporal Graph Analytics (Mini-Challenge 1), DOI:10.1109/VAST.2017.8585686, 2017Materials
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