D. Jäckle, M. Hund, M. Behrisch, D. A. Keim and T. Schreck.
Pattern Trails: Visual Analysis of Pattern Transitions in Subspaces (2017)
SFB-TRR161 VALCRI Peer-Reviewed Full-Paper Conference
Type Inproceedings
Submitted Yes
Published Yes
Public Yes
Published in IEEE Conference on Visual Analytics Science and Technology (VAST)
Documents http://dominikjaeckle.com/projects/2017/pattern_trails/, jaecklevast.pdf
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